HOME > 論文 > 書誌詳細Improved depth resolution of secondary ion mass spectrometry profiles in diamond: A quantitative analysis of the delta-dopingAlexandre Fiori, François Jomard, Tokuyuki Teraji, Gauthier Chicot, Etienne Bustarret. Thin Solid Films 557 222-226. 2014.https://doi.org/10.1016/j.tsf.2013.10.076 NIMS著者寺地 徳之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:45:24 +0900 更新時刻: 2026-02-21 04:17:15 +0900
