HOME > Article > DetailImproved depth resolution of secondary ion mass spectrometry profiles in diamond: A quantitative analysis of the delta-dopingAlexandre Fiori, François Jomard, Tokuyuki Teraji, Gauthier Chicot, Etienne Bustarret. Thin Solid Films 557 222-226. 2014.https://doi.org/10.1016/j.tsf.2013.10.076 Open Access Elsevier BV (Publisher) NIMS author(s)TERAJI, TokuyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:45:24 +0900Updated at: 2024-03-29 18:41:09 +0900