HOME > 論文 > 書誌詳細Improving Accuracy of Sample Surface Topography by Atomic Force MicroscopyMingsheng Xu, Daisuke Fujita, Keiko Onishi, Kunichi Miyazawa. Journal of Nanoscience and Nanotechnology 9 [10] 6003-6007. 2009.https://doi.org/10.1166/jnn.2009.1232 NIMS著者大西 桂子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:40:31 +0900 更新時刻: 2026-10-01 04:23:03 +0900
