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NIMS Award Symposium 2026

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Degradation of vertical GaN diodes during proton and xenon-ion irradiation

Hironori Okumura, Yohei Ogawara, Manabu Togawa, Masaya Miyahara, Tadaaki Isobe, Kosuke Itabashi, Jiro Nishinaga, Masataka Imura.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


Created at: 2024-04-24 03:12:02 +0900 Updated at: 2026-09-25 04:30:19 +0900

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