HOME > 論文 > 書誌詳細Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopyTomonori Nakamura, Nobuyuki Ishida, Keisuke Sagisaka, Yasuo Koide. AIP Advances 10 [8] 085010. 2020.https://doi.org/10.1063/5.0007524 Open Access AIP Publishing (Publisher) NIMS著者石田 暢之鷺坂 恵介小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-12-18 03:00:17 +0900更新時刻: 2024-10-06 05:44:41 +0900
