Surface Potential Visualization in Organic Antiambipolar Transistors Using Operando Kelvin Probe Force Microscopy for Understanding the Comprehensive Carrier Transport Mechanism | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Surface Potential Visualization in Organic Antiambipolar Transistors Using Operando Kelvin Probe Force Microscopy for Understanding the Comprehensive Carrier Transport Mechanism

Ryoma Hayakawa, Soichiro Takeiri, Yoichi Yamada, Yutaka Wakayama.

Advanced Materials Interfaces 10 [19] 2201857. 2023.

https://doi.org/10.1002/admi.202201857

Open Access Wiley (Publisher)

NIMS著者

早川竜馬

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-07-22 03:27:17 +0900更新時刻: 2024-04-28 03:04:18 +0900

▲ページトップへ移動