Surface Potential Visualization in Organic Antiambipolar Transistors Using Operando Kelvin Probe Force Microscopy for Understanding the Comprehensive Carrier Transport Mechanism | SAMURAI, NIMS Researchers Directory Service

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Surface Potential Visualization in Organic Antiambipolar Transistors Using Operando Kelvin Probe Force Microscopy for Understanding the Comprehensive Carrier Transport Mechanism

Ryoma Hayakawa, Soichiro Takeiri, Yoichi Yamada, Yutaka Wakayama.

Advanced Materials Interfaces 10 [19] 2201857. 2023.

https://doi.org/10.1002/admi.202201857

NIMS author(s)

HAYAKAWA, Ryoma

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2023-07-22 03:27:17 +0900 Updated at: 2025-11-19 09:28:27 +0900

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