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Ga,N solubility limit in co-implanted ZnO measured by secondary ion mass spectrometry
(Ga,Nの酸化亜鉛への同時イオン注入における固溶限の2次イオン質量分析計による測定)

Applied Surface Science 189 [3-4] 349-352. 2002.

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    Created at: 2016-05-24 11:49:32 +0900 Updated at: 2026-10-03 06:15:26 +0900

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