HOME > 論文 > 書誌詳細Hydrogen-terminated defects in ion-implanted silicon probed by monoenergetic positron beams(低速陽電子ビームによるイオン注入Siの水素ー空孔複合体の検出)Akira Uedono, Toshiki Mori, Kunitomo Morisawa, Kouichi Murakami, Toshiyuki Ohdaira, Ryoichi Suzuki, Tomohisa Mikado, Kunie Ishioka, Masahiro Kitajima, Shunichi Hishita, Hajime Haneda, Isao Sakaguchi. Journal of Applied Physics 93 [6] 3228-3233. 2003.https://doi.org/10.1063/1.1542923 NIMS著者石岡 邦江菱田 俊一羽田 肇坂口 勲Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 11:55:54 +0900 更新時刻 :2020-11-16 22:58:30 +0900