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Structural characterization and transistor properties of thickness-controllable MoS2 thin films

著者Yesul Jeong, Ji Yeong Sung, Yunju Choi, Jong Sung Jin, Jang-Hee Yoon, Sinae Heo, Ryoma Hayakawa, Yutaka Wakayama.
掲載誌名Journal of Materials Science 54 [10] 7758-7767
ISSN: 00222461, 15734803
ESIでのカテゴリ: MATERIALS SCIENCE
出版社Springer Nature
発表年2019
言語English
DOIhttps://doi.org/10.1007/s10853-019-03435-6
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