HOME > 論文 > 書誌詳細Structural characterization and transistor properties of thickness-controllable MoS2 thin filmsYesul Jeong, Ji Yeong Sung, Yunju Choi, Jong Sung Jin, Jang-Hee Yoon, Sinae Heo, Ryoma Hayakawa, Yutaka Wakayama. Journal of Materials Science 54 [10] 7758-7767. 2019.https://doi.org/10.1007/s10853-019-03435-6 NIMS著者早川 竜馬若山 裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-14 00:39:04 +0900更新時刻: 2024-04-02 01:55:04 +0900
