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Structural characterization and transistor properties of thickness-controllable MoS2 thin films

Yesul Jeong, Ji Yeong Sung, Yunju Choi, Jong Sung Jin, Jang-Hee Yoon, Sinae Heo, Ryoma Hayakawa, Yutaka Wakayama.
Journal of Materials Science 54 [10] 7758-7767. 2019.

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    Created at :2019-03-14 00:39:04 +0900 Updated at :2020-11-16 22:08:42 +0900

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