HOME > Article > DetailStructural characterization and transistor properties of thickness-controllable MoS2 thin filmsYesul Jeong, Ji Yeong Sung, Yunju Choi, Jong Sung Jin, Jang-Hee Yoon, Sinae Heo, Ryoma Hayakawa, Yutaka Wakayama. Journal of Materials Science 54 [10] 7758-7767. 2019.https://doi.org/10.1007/s10853-019-03435-6 NIMS author(s)HAYAKAWA, RyomaWAKAYAMA, YutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-03-14 00:39:04 +0900 Updated at :2020-11-16 22:08:42 +0900