The electrical conductivity of cubic (In<sub>1−x </sub>Ga<sub> x </sub>)<sub>2</sub>O<sub>3</sub> films (x ≤ 0.18): native bulk point defects, Sn-doping, and the surface electron accumulation layer | SAMURAI, NIMS Researchers Directory Service

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The electrical conductivity of cubic (In1−x Ga x )2O3 films (x ≤ 0.18): native bulk point defects, Sn-doping, and the surface electron accumulation layer

Alexandra Papadogianni, Takahiro Nagata, Oliver Bierwagen.

Japanese Journal of Applied Physics 61 [4] 045502. 2022.

https://doi.org/10.35848/1347-4065/ac4ec7

Open Access IOP Publishing (Publisher)

NIMS author(s)

NAGATA, Takahiro

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-05-28 03:12:22 +0900Updated at: 2024-03-31 16:38:57 +0900

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