HOME > Article > DetailNon-destructive and non-contact measurement of semiconductor optical waveguide using optical coherence tomography with a visible broadband light sourceKazumasa Ishida, Nobuhiko Ozaki, Hirotaka Ohsato, Eiichiro Watanabe, Naoki Ikeda, Yoshimasa Sugimoto. Japanese Journal of Applied Physics 57 [8S2] 08PE03. 2018.https://doi.org/10.7567/jjap.57.08pe03 NIMS author(s)WATANABE, EiichiroIKEDA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-07-19 15:30:33 +0900Updated at: 2024-04-01 21:16:49 +0900