Quantifying mean inner potential of ZnO nanowires by off-axis electron holography | SAMURAI, NIMS Researchers Directory Service

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Quantifying mean inner potential of ZnO nanowires by off-axis electron holography
(オフ角電子ホログラフィによるZnOナノワイヤの実効内部ポテンシャル計測)

Yong Ding, Yuzi Liu, Ken C. Pradel, Yoshio Bando, Naoki Fukata, Zhong Lin Wang.

Micron 78 67-72. 2015.

https://doi.org/10.1016/j.micron.2015.07.008

Open Access Elsevier BV (Publisher)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:58:35 +0900Updated at: 2024-04-30 04:18:46 +0900

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