HOME > Article > DetailQuantifying mean inner potential of ZnO nanowires by off-axis electron holography(オフ角電子ホログラフィによるZnOナノワイヤの実効内部ポテンシャル計測)Yong Ding, Yuzi Liu, Ken C. Pradel, Yoshio Bando, Naoki Fukata, Zhong Lin Wang. Micron 78 67-72. 2015.https://doi.org/10.1016/j.micron.2015.07.008 NIMS author(s)BANDO, YoshioFUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:58:35 +0900 Updated at: 2026-09-28 04:16:00 +0900