Scanning electron irradiation of hexagonal boron nitride: an efficient procedure for quenching undesired defects emissions monitored by <i>in-situ</i> room temperature cathodoluminescence | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Scanning electron irradiation of hexagonal boron nitride: an efficient procedure for quenching undesired defects emissions monitored by in-situ room temperature cathodoluminescence

F Bianco, S Pezzini, K Watanabe, T Taniguchi, F Fabbri.

2D Materials 12 [2] 025026. 2025.

https://doi.org/10.1088/2053-1583/adc119

Open Access IOP Publishing (Publisher) Materials Data Repository (MDR)

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MDRavailable Scanning electron irradiation of hexagonal boron nitride: an efficient procedure for quenching undesired defects emissions monitored by <i>in-situ</i> room temperature cathodoluminescence

作成時刻: 2025-04-15 03:06:41 +0900 更新時刻: 2026-10-01 06:24:49 +0900

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