Denoising Scanning Tunneling Microscopy Images with Machine Learning

Frédéric Joucken; John L. Davenport; Zhehao Ge; Eberth A. Quezada-Lopez; Takashi Taniguchi; Kenji Watanabe; Jairo Velasco; Jérôme Lagoute; Robert A. Kaindl

doi:10.1103/physrevmaterials.6.123802

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Denoising scanning tunneling microscopy images of graphene with supervised machine learning
(Denoising Scanning Tunneling Microscopy Images with Machine Learning)

Frédéric Joucken, John L. Davenport, Zhehao Ge, Eberth A. Quezada-Lopez, Takashi Taniguchi, Kenji Watanabe, Jairo Velasco, Jérôme Lagoute, Robert A. Kaindl.

Physical Review Materials 6 [12] 123802. 2022.

https://doi.org/10.1103/physrevmaterials.6.123802

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2022-12-29 03:28:57 +0900更新時刻: 2024-03-31 17:10:34 +0900

Denoising scanning tunneling microscopy images of graphene with supervised machine learning(Denoising Scanning Tunneling Microscopy Images with Machine Learning)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Denoising scanning tunneling microscopy images of graphene with supervised machine learning
(Denoising Scanning Tunneling Microscopy Images with Machine Learning)