Denoising scanning tunneling microscopy images of graphene with supervised machine learning
(Denoising Scanning Tunneling Microscopy Images with Machine Learning)
| 著者 | Frédéric Joucken, John L. Davenport, Zhehao Ge, Eberth A. Quezada-Lopez, Takashi Taniguchi, Kenji Watanabe, Jairo Velasco, Jérôme Lagoute, Robert A. Kaindl. |
|---|---|
| 掲載誌名 | Physical Review Materials 6 [12] 123802 ISSN: 24759953 ESIでのカテゴリ: MATERIALS SCIENCE |
| 出版社 | American Physical Society (APS) |
| 発表年 | 2022 |
| 言語 | English |
| DOI | https://doi.org/10.1103/physrevmaterials.6.123802 |
| この文献をMendeleyにインポート |  |