Antireflection Substrates for Determining the Number of Layers of Few-Layer Hexagonal Boron Nitride Films and for Visualizing Organic Monolayers | SAMURAI, NIMS Researchers Directory Service

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Antireflection Substrates for Determining the Number of Layers of Few-Layer Hexagonal Boron Nitride Films and for Visualizing Organic Monolayers

Yoshiaki Hattori, Takashi Taniguchi, Kenji Watanabe, Masatoshi Kitamura.

ACS Applied Nano Materials 6 [23] 21876-21886. 2023.

https://doi.org/10.1021/acsanm.3c04075

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2023-12-23 03:15:06 +0900 Updated at: 2026-09-29 09:46:45 +0900

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