Antireflection Substrates for Determining the Number of Layers of Few-Layer Hexagonal Boron Nitride Films and for Visualizing Organic Monolayers | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Antireflection Substrates for Determining the Number of Layers of Few-Layer Hexagonal Boron Nitride Films and for Visualizing Organic Monolayers

Yoshiaki Hattori, Takashi Taniguchi, Kenji Watanabe, Masatoshi Kitamura.

ACS Applied Nano Materials 6 [23] 21876-21886. 2023.

https://doi.org/10.1021/acsanm.3c04075

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作成時刻: 2023-12-23 03:15:06 +0900更新時刻: 2024-05-01 10:04:17 +0900

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