HOME > 論文 > 書誌詳細Microstructure and shape memory behavior of annealed Ti51.5Ni33.1Cu15.4 thin filmsA. Ishida, M. Sato, K. Ogawa. Philosophical Magazine Letters 86 [1] 13-20. 2006.https://doi.org/10.1080/09500830500482308 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:47:02 +0900 更新時刻: 2026-11-02 05:30:33 +0900
