Evidence of defect formation in monolayer MoS<sub>2</sub> at ultralow accelerating voltage electron irradiation

Ajit Kumar Dash; Hariharan Swaminathan; Ethan Berger; Mainak Mondal; Touko Lehenkari; Pushp Raj Prasad; Kenji Watanabe; Takashi Taniguchi; Hannu-Pekka Komsa; Akshay Singh; Ajit Kumar Dash; Hariharan Swaminathan; Ethan Berger; Mainak Mondal; Touko Lehenkari; Pushp Raj Prasad; Kenji Watanabe; Takashi Taniguchi; Hannu-Pekka Komsa; Akshay Singh

doi:10.1088/2053-1583/acc7b6

Evidence of defect formation in monolayer MoS₂ at ultralow accelerating voltage electron irradiation

Ajit Kumar Dash, Hariharan Swaminathan, Ethan Berger, Mainak Mondal, Touko Lehenkari, Pushp Raj Prasad, Kenji Watanabe, Takashi Taniguchi, Hannu-Pekka Komsa, Akshay Singh.

2D Materials 10 [3] 035002. 2023.

https://doi.org/10.1088/2053-1583/acc7b6

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2023-10-22 03:13:43 +0900 Updated at: 2026-09-29 09:41:24 +0900

Evidence of defect formation in monolayer MoS2 at ultralow accelerating voltage electron irradiation

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Evidence of defect formation in monolayer MoS₂ at ultralow accelerating voltage electron irradiation