XPS Study of Surface Enrichment Process of Carbon on C-Doped Ni(111) Using Inelasstic Background Analysis
(Ｃを固溶させたNi(111)単結晶表面での炭素原子富化過程のXPS非弾性散乱電子バックグラウンド解析による研究)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:35:38 +0900 Updated at: 2026-11-01 04:49:48 +0900