HOME > 論文 > 書誌詳細Direct observation of inversion capacitance in p-type diamond MOS capacitors with an electron injection layerTsubasa Matsumoto, Hiromitsu Kato, Toshiharu Makino, Masahiko Ogura, Daisuke Takeuchi, Satoshi Yamasaki, Masataka Imura, Akihiro Ueda, Takao Inokuma, Norio Tokuda. Japanese Journal of Applied Physics 57 [4S] 04FR01. 2018.https://doi.org/10.7567/jjap.57.04fr01 NIMS著者井村 将隆Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-04-20 20:58:37 +0900更新時刻: 2024-04-01 22:48:26 +0900