HOME > 論文 > 書誌詳細Lithiation of the crystalline silicon as analyzed using soft X-ray emission spectroscopy and windowless energy dispersive X-ray spectroscopyHuiwen Lin, Kohei Uosaki, Hidenori Noguchi. Applied Surface Science 569 151040. 2021.https://doi.org/10.1016/j.apsusc.2021.151040 Open Access Elsevier BV (Publisher) NIMS著者魚崎 浩平野口 秀典Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-11-27 03:36:25 +0900更新時刻: 2024-03-31 14:35:55 +0900