Lithiation of the crystalline silicon as analyzed using soft X-ray emission spectroscopy and windowless energy dispersive X-ray spectroscopy
| Author(s) | Huiwen Lin, Kohei Uosaki, Hidenori Noguchi. |
|---|---|
| Journal title | Applied Surface Science 569 151040 ISSN: 01694332 ESI category: MATERIALS SCIENCE |
| Publisher | Elsevier BV |
| Year of publication | 2021 |
| Language | English |
| DOI | https://doi.org/10.1016/j.apsusc.2021.151040 |
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