Correlation between film thickness and zinc defect distribution along the growth direction in an isotopic multilayer ZnO thin film grown by pulsed laser deposition analyzed using the internal diffusion method | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Correlation between film thickness and zinc defect distribution along the growth direction in an isotopic multilayer ZnO thin film grown by pulsed laser deposition analyzed using the internal diffusion method

Kenji Matsumoto, Yutaka Adachi, Takeshi Ohgaki, Naoki Ohashi, Hajime Haneda, Isao Sakaguchi.

Solid State Communications 150 [43-44] 2118-2121. 2010.

https://doi.org/10.1016/j.ssc.2010.09.015

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作成時刻: 2016-05-24 16:11:56 +0900更新時刻: 2024-04-02 04:32:20 +0900

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