Correlation between film thickness and zinc defect distribution along the growth direction in an isotopic multilayer ZnO thin film grown by pulsed laser deposition analyzed using the internal diffusion method | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Correlation between film thickness and zinc defect distribution along the growth direction in an isotopic multilayer ZnO thin film grown by pulsed laser deposition analyzed using the internal diffusion method

Kenji Matsumoto, Yutaka Adachi, Takeshi Ohgaki, Naoki Ohashi, Hajime Haneda, Isao Sakaguchi.

Solid State Communications 150 [43-44] 2118-2121. 2010.

https://doi.org/10.1016/j.ssc.2010.09.015

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:11:56 +0900 Updated at: 2025-04-20 04:30:52 +0900

▲ Go to the top of this page