HOME > 論文 > 書誌詳細Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected MicroscopeA Hashimoto, P Wang, M Shimojo, K Mitsuishi, AI Kirkland, PD Nellist, M Takeguchi. Microscopy and Microanalysis 16 [S2] 1888-1889. 2010.https://doi.org/10.1017/s1431927610058022 NIMS著者橋本 綾子三石 和貴竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-06-08 20:57:07 +0900更新時刻: 2024-04-01 22:37:14 +0900
