HOME > Article > DetailIrradiation Temperature Dependence of Residual Defects in 17MeV-Proton Bombereded Silicon(17MeVプロトン照射したSiにおける残留欠陥の照射温度依存性)AMEKURA, Hiroshi, 岸本直樹, KONO, Kenichiro, 斎藤鉄哉. Materials Science Forum 1159-1164. 1995.NIMS author(s)AMEKURA, HiroshiKONO, KenichiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-11-15 00:39:05 +0900 Updated at: 2022-11-15 00:39:05 +0900