Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy

Hongxuan Guo, Jianhua Gao, Nobuyuki Ishida, Mingsheng Xu, Daisuke Fujita.

Applied Physics Letters 104 [3] 031607. 2014.

https://doi.org/10.1063/1.4862819

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:41:54 +0900Updated at: 2024-04-02 03:50:18 +0900

▲ Go to the top of this page