HOME > Article > DetailCharacterization of Cu/Ti Multi-Layered Structure by Improved Sputter Crater MethodTakeshi Hatano, 中村恵吉, 浅田雄司, 小川恵一, 小口醇, Keikichi Nakamura, Yuji Asada, Keiichi Ogawa, Atsushi Oguchi. Japanese Journal of Applied Physics 25 [Part 1, No. 6] 912-913. 1986.https://doi.org/10.1143/jjap.25.912 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:28:58 +0900 Updated at: 2026-10-03 06:09:38 +0900
