Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: delamination, real-time cracking and substrate buckling

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Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: Delamination, real-time cracking and substrate buckling
(Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: delamination, real-time cracking and substrate buckling)

David Framil Carpeño, Takahito Ohmura, Ling Zhang, Jérôme Leveneur, Michelle Dickinson, Christopher Seal, John Kennedy, Margaret Hyland.

作成時刻: 2016-05-24 18:03:08 +0900更新時刻: 2024-04-01 20:08:43 +0900