Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: Delamination, real-time cracking and substrate buckling
(Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: delamination, real-time cracking and substrate buckling)
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Created at: 2016-05-24 18:03:08 +0900Updated at: 2024-05-02 06:54:29 +0900