Statistically Analyzed Photoresponse of Elastically Bent CdS Nanowires Probed by Light-Compatible In Situ High-Resolution TEM | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Statistically Analyzed Photoresponse of Elastically Bent CdS Nanowires Probed by Light-Compatible In Situ High-Resolution TEM
(Statistically analyzed photoresponse of elastically bent CdS nanowires probed by light-compatible in situ high-resolution TEM)

Chao Zhang, Ovidiu Cretu, Dmitry G. Kvashnin, Naoyuki Kawamoto, Masanori Mitome, Xi Wang, Yoshio Bando, Pavel B. Sorokin, Dmitri Golberg.

Nano Letters 16 [10] 6008-6013. 2016.

https://doi.org/10.1021/acs.nanolett.6b01614

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作成時刻: 2016-10-26 15:44:58 +0900更新時刻: 2024-09-06 04:46:45 +0900

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