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著者名Mickael Lozac'h, Shigenori Ueda, Shitao Liu, Hideki Yoshikawa, Sang Liwen, Xinqiang Wang, Bo Shen, Kazuaki Sakoda, Keisuke Kobayashi, Masatomo Sumiya.
タイトルDetermination of the surface band bending in InxGa1−xN films by hard x-ray photoemission spectroscopy
掲載誌名Science and Technology of Advanced Materials 14 [1] 015007
ISSN: 18785514 14686996
発表年2013
言語English
DOI10.1088/1468-6996/14/1/015007
ESIでのカテゴリMATERIALS SCIENCE
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