HOME > Article > DetailStrain-free thin film growth of vanadium dioxide deposited on 2D atomic layered material of hexagonal boron nitride investigated by their thickness dependence of insulator–metal transition behaviorBoyuan Yu, Shingo Genchi, Kenji Watanabe, Takashi Taniguchi, Hidekazu Tanaka. Applied Physics Express 18 [2] 025502. 2025.https://doi.org/10.35848/1882-0786/adaf09 Open Access IOP Publishing (Publisher) NIMS author(s)WATANABE, KenjiTANIGUCHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2025-02-23 03:10:50 +0900 Updated at: 2026-09-12 04:31:58 +0900