HOME > Article > DetailDetermination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission(Determination of Schottky Barrier Profile at Pt/SrTiO3:Nb Junction by X-ray Photoemission )Naoki Ohashi, Hideki Yoshikawa, Yoshiyuki Yamashita, Shigenori Ueda, Jianyong Li, Hideyo Okushi, Keisuke Kobayashi, Hajime Haneda. Applied Physics Letters 101 [25] 251911. 2012.https://doi.org/10.1063/1.4772628 NIMS author(s)OHASHI, NaokiYOSHIKAWA, HidekiYAMASHITA, YoshiyukiUEDA, ShigenoriHANEDA, HajimeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:52:43 +0900Updated at: 2024-03-31 15:05:27 +0900