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A system for measuring the adhesion forces of micro-objects in a scanning electron microscope

Hideki T. Miyazaki, 新谷紀雄, Yasushi Tomizawa, Koichi Koyama, Tomomasa Sato, Yasushi Tomizawa, Koichi Koyano, Tomomasa Sato, Norio Shinya.
Review of Scientific Instruments 71 [8] 3123-3131. 2000.


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    作成時刻: 2016-05-24 11:41:01 +0900更新時刻: 2024-07-04 06:45:19 +0900