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A system for measuring the adhesion forces of micro-objects in a scanning electron microscope
(走査電子顕微鏡下での微小物体の付着力測定システム)

Hideki T. Miyazaki, 新谷紀雄, Yasushi Tomizawa, Koichi Koyama, Tomomasa Sato, Yasushi Tomizawa, Koichi Koyano, Tomomasa Sato, Norio Shinya.
Review of Scientific Instruments 71 [8] 3123-3131. 2000.

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