A system for measuring the adhesion forces of micro-objects in a scanning electron microscope
(走査電子顕微鏡下での微小物体の付着力測定システム)
| Author(s) | Hideki T. Miyazaki, 新谷紀雄, Yasushi Tomizawa, Koichi Koyama, Tomomasa Sato, Yasushi Tomizawa, Koichi Koyano, Tomomasa Sato, Norio Shinya. |
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| Journal title | Review of Scientific Instruments 71 [8] 3123-3131 ISSN: 00346748, 10897623 ESI category: CHEMISTRY |
| Publisher | |
| Year of publication | 2000 |
| Language | English |
| DOI | https://doi.org/10.1063/1.1305812 |
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