HOME > 論文 > 書誌詳細Atom probe tomography of compositional fluctuation in GaInN layersYuya Kanitani, Shinji Tanaka, Shigetaka Tomiya, Tadakatsu Ohkubo, Kazuhiro Hono. Japanese Journal of Applied Physics 55 [5S] 05FM04. 2016.https://doi.org/10.7567/jjap.55.05fm04 NIMS著者大久保 忠勝宝野 和博Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-19 23:35:31 +0900更新時刻: 2024-04-01 23:30:24 +0900
