HOME > Article > DetailAtom probe tomography of compositional fluctuation in GaInN layersYuya Kanitani, Shinji Tanaka, Shigetaka Tomiya, Tadakatsu Ohkubo, Kazuhiro Hono. Japanese Journal of Applied Physics 55 [5S] 05FM04. 2016.https://doi.org/10.7567/jjap.55.05fm04 NIMS author(s)OHKUBO, TadakatsuHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-19 23:35:31 +0900Updated at: 2024-05-02 10:12:15 +0900
