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Imaging of diamond defect sites by electron-beam-induced current
(Imaging of Diamond Defect Sites by Electron-Beam-Induced Current)

S. Kono, T. Teraji, H. Kodama, A. Sawabe.
Diamond and Related Materials 59 54-61. 2015.
https://doi.org/10.1016/j.diamond.2015.09.006

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    作成時刻: 2016-05-24 17:57:05 +0900 更新時刻: 2026-03-24 05:01:48 +0900

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