HOME > Article > DetailImaging of diamond defect sites by electron-beam-induced current(Imaging of Diamond Defect Sites by Electron-Beam-Induced Current)S. Kono, T. Teraji, H. Kodama, A. Sawabe. Diamond and Related Materials 59 54-61. 2015.https://doi.org/10.1016/j.diamond.2015.09.006 NIMS author(s)TERAJI, TokuyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:57:05 +0900Updated at: 2024-04-01 18:25:50 +0900