HOME > 論文 > 書誌詳細Surface defects and accompanying imperfections in 4H–SiC: Optical, structural and electrical characterizationBin Chen, Hirofumi Matsuhata, Takashi Sekiguchi, Kyouichi Ichinoseki, Hajime Okumura. Acta Materialia 60 [1] 51-58. 2012.https://doi.org/10.1016/j.actamat.2011.09.010 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:49:01 +0900更新時刻: 2025-01-16 05:02:30 +0900
