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Surface defects and accompanying imperfections in 4H–SiC: Optical, structural and electrical characterization

Bin Chen, Hirofumi Matsuhata, Takashi Sekiguchi, Kyouichi Ichinoseki, Hajime Okumura.
Acta Materialia 60 [1] 51-58. 2012.
https://doi.org/10.1016/j.actamat.2011.09.010

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