In situ observation of charge exchange and surface segregation of hydrogen during low energy H+ and H2+ scattering from semicond | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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In situ observation of charge exchange and surface segregation of hydrogen during low energy H+ and H2+ scattering from semicond

SOUDA, Ryutaro, 浅利栄治, SUZUKI, Taku, 田中高穂, AIZAWA, Takashi.

Physical Review Letters . 1998.

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作成時刻: 2022-09-05 10:52:49 +0900 更新時刻: 2022-09-05 10:52:49 +0900

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