HOME > 論文 > 書誌詳細Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopyPD Nellist, P Wang, G Behan, AI Kirkland, A Hashimoto, M Shimojo, K Mitsuishi, M Takeguchi, E Cosgriff, AJ D'Alfonso, LJ Allen, SD Findlay. Microscopy and Microanalysis 16 [S2] 1834-1835. 2010.https://doi.org/10.1017/s1431927610057533 NIMS著者橋本 綾子三石 和貴竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-06-08 20:56:10 +0900 更新時刻: 2026-10-03 05:06:23 +0900
