Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method

Takuto Kojima, Tomihisa Tachibana, Yoshio Ohshita, Ronit R. Prakash, Takashi Sekiguchi, Masafumi Yamaguchi.

Journal of Applied Physics 119 [6] 065302. 2016.

https://doi.org/10.1063/1.4940709

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作成時刻: 2016-11-01 03:29:16 +0900更新時刻: 2024-03-29 23:43:56 +0900

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