Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method | SAMURAI, NIMS Researchers Directory Service

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Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method

Takuto Kojima, Tomihisa Tachibana, Yoshio Ohshita, Ronit R. Prakash, Takashi Sekiguchi, Masafumi Yamaguchi.

Journal of Applied Physics 119 [6] 065302. 2016.

https://doi.org/10.1063/1.4940709

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Created at: 2016-11-01 03:29:16 +0900Updated at: 2024-03-29 23:43:56 +0900

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