HOME > 論文 > 書誌詳細Numrical prediction of fraction of eutectic phase in Sn-Ag-Cu soldering using the phase-field methodMachiko Ode, Minoru Ueshima, Taichi Abe, Hideyuki Murakami, Hidehiro Onodera. Journal of Electronic Materials 35 [11] 1969-1974. 2006.https://doi.org/10.1007/s11664-006-0301-z NIMS著者大出 真知子阿部 太一村上 秀之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:06:29 +0900更新時刻: 2024-04-01 19:08:32 +0900
