HOME > 論文 > 書誌詳細Round-robin layer-thickness determination: Toward reliable reference-free X-ray spectrometryKenji Sakurai, Akira Kurokawa. X-Ray Spectrometry 48 [1] 3-7. 2019.https://doi.org/10.1002/xrs.2978 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-01 11:36:59 +0900更新時刻: 2024-03-31 01:46:33 +0900
